New shortwave infrared albedo measurements for snow specific surface area retrieval
نویسندگان
چکیده
منابع مشابه
Measuring specific surface area of snow by near-infrared photography
The specific surface area (SSA) is considered an essential microstructural parameter for the characterization of snow. Photography in the near-infrared (NIR) spectrum is sensitive to the SSA. We calculated the snow reflectance from calibrated NIR images of snow-pit walls and measured the SSA of samples obtained at the same locations. This new method is used to map the snow stratigraphy. The cor...
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ژورنال
عنوان ژورنال: Journal of Glaciology
سال: 2012
ISSN: 0022-1430,1727-5652
DOI: 10.3189/2012jog11j248